POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES

Author's Name: Sandeep Gupta

Type: Article

ISSN/ISBN: 2455-9679

DOI Link: https://doie.org/10.10206/IJRTSM.2025532296

Journal Name: International Journal of Recent Technology Science & Management

Volume: 10

Issue: 8

Month: 08

Year: 2025

Date: 2025-08-01